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AELAB EDX-9000 X-Ray Fluorescence Spectrometer for Elemental Analysis

The AELAB EDX-9000 X-Ray Fluorescence Spectrometer performs rapid, accurate, and non-destructive elemental analysis for laboratory and industrial testing. Utilizing silicon drift detector technology and digital multi-channel processing, the system quantifies elements from Na to U across ppm to 99.99% concentration ranges, supporting quality control, mineral analysis, and hazardous element detection.
Modles : EDX Series
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The AELAB EDX-9000 X-Ray Fluorescence Spectrometer is engineered to perform rapid and accurate non-destructive elemental analysis for laboratory and industrial testing. Based on advanced XRF detection technology, the system delivers stable excitation and precise analysis across a wide range of elements.

Incorporating intelligent vacuum system XRF technology, the AELAB EDX-9000 achieves effective excitation and accurate analysis for light elements such as Na, Mg, Al, and Si, as well as high atomic number elements including Cr, Ni, and Mo, significantly improving analytical efficiency and test throughput.

 

⚙️ Design & Construction

The AELAB EDX-9000 features a high-efficient and extremely thin window X-ray tube combined with a Silicon Drift Detector (SDD). The instrument integrates an optical amplification system, high signal-to-noise electronic circuit unit, and an automatic collimator and filter switching mechanism to ensure stable analytical performance.

 

🔬 Working Principle / Testing Method

The AELAB EDX-9000 operates by exciting samples with controlled X-ray energy, inducing characteristic fluorescence emission from constituent elements. The emitted signals are captured by the SDD detector and processed through digital multi-channel technology to quantify elemental composition with high energy resolution and spectral stability.

 

💡 Key Advantages

  • Non-destructive elemental analysis from Na to U
  • Digital multi-channel technology enabling high counting ability
  • Energy resolution of 145±5 eV with excellent spectral linearity
  • Automatic spectrum-stabilizing device for long-term measurement stability
  • Built-in HD camera for sample observation
  • Automatic switching of collimators and filters
  • High peak-to-background ratio for trace element detection

 

🔗 Connectivity & Integration

The AELAB EDX-9000 is equipped with an integrated LCD display that directly presents testing results including tube voltage, tube current, and vacuum degree. External software and communication interface details are not specified in the provided documentation.

 

🧠 Model Insight

Model Configuration Overview – AELAB EDX-9000
Element Range Na–U
Detector Type Silicon Drift Detector (SDD)
Instrument Weight (kg) 60

 

🧪 Testing Applications

The AELAB EDX-9000 X-Ray Fluorescence Spectrometer is widely applied in mineral analysis, alloy composition analysis, smelting process control, full-element analysis, and hazardous element analysis. The system supports laboratory research, industrial quality control, and material verification workflows.

 

Compliance & Quality Assurance

The AELAB EDX-9000 is designed for operation within regulated laboratory and industrial environments. Analytical repeatability, spectral stability, and electronic signal integrity support quality assurance processes aligned with standardized testing protocols.

 

Discover accurate and stable elemental analysis with the AELAB EDX-9000 X-Ray Fluorescence Spectrometer — engineered by AELAB for advanced laboratory and industrial material testing.

 

AELAB EDX-9000 X-ray fluorescence spectrometer

Specifications :

Technical Specifications – AELAB EDX-9000
Product Type X-Ray Fluorescence Spectrometer
Product Name EDX-9000
Analytical Elements Na to U
Analytical Range ppm–99.99% (different elements enjoy different analytical range)
Simultaneous Analysis Capable of testing tens of elements simultaneously
Measurement Time 30–200 s
Energy Resolution 145±5 eV
Tube Voltage 5 kV–50 kV
Tube Current 50 μA–1000 μA
Measurable Objects Powder, Solid, Liquid
Voltage Input AC 110 V / 220 V
Operating Temperature (°C) 15–30 °C
Operating Humidity 35%–70%
Instrument Dimensions (mm) 600 × 500 × 500
Weight (kg) 60
Technical Specifications – AELAB EDX-9000
Product Type X-Ray Fluorescence Spectrometer
Product Name EDX-9000
Analytical Elements Na to U
Analytical Range ppm–99.99% (different elements enjoy different analytical range)
Simultaneous Analysis Capable of testing tens of elements simultaneously
Measurement Time 30–200 s
Energy Resolution 145±5 eV
Tube Voltage 5 kV–50 kV
Tube Current 50 μA–1000 μA
Measurable Objects Powder, Solid, Liquid
Voltage Input AC 110 V / 220 V
Operating Temperature (°C) 15–30 °C
Operating Humidity 35%–70%
Instrument Dimensions (mm) 600 × 500 × 500
Weight (kg) 60

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Frequently Asked Questions

1What elements can the AELAB EDX-9000 analyze?
The instrument analyzes elements from sodium (Na) to uranium (U).
2Is the analysis destructive?
No, the AELAB EDX-9000 performs non-destructive elemental analysis.
3What sample types are supported?
Powder, solid, and liquid samples can be measured.
4How long does a measurement take?
Typical measurement time ranges from 30 to 200 seconds.
5Is the system suitable for industrial quality control?
Yes, it is widely used for mineral analysis, alloy testing, smelting control, and hazardous element analysis.

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