Model :XXG-1605、XXG-2005、XXG-2505、XXG-3005、XXQ-1605、XXQ-2005、XXQ-2505、XXQ-3005、EVO 160D、EVO 200D、EVO 300D、Golden150、Golden270、Golden370
The AL-NP-5010A uses advanced EDXRF technology for simultaneous multi-element analysis (Na to U), tailored to user needs. It excels in environmental, archaeological, and industrial applications, ensuring reliable quality control.
XRF spectrometry provides precise elemental analysis (Be to U) across solids, powders, and liquids, with concentration ranges from 0.1 PPM to 100%. Its simple sample preparation and broad capabilities make it highly versatile.
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The AL-NP-5010A utilizes advanced energy-dispersive X-ray fluorescence (EDXRF) technology to simultaneously measure multiple elements in a substance, from sodium (Na) to uranium (U), based on user application needs. It is highly versatile, suitable for environmental protection, archaeology, building materials, RoHS compliance, and other industries, making it an ideal tool for enterprise quality control.
XRF spectrometry offers precise qualitative, quantitative, and non-standard elemental analysis for almost all elements, from beryllium (Be) to uranium (U), in various sample forms, including solids, powders, and liquids. It supports concentration analyses from 0.1 PPM to 100%, allowing even undiluted measurements of high-concentration samples. The technique is distinguished by its simplicity in sample preparation and broad measurement capabilities.
Feature:
Simultaneous Multi-Element Analysis:
Versatile Sample Compatibility:
Wide Concentration Range:
Broad Application Scope:
Portable X-ray Flaw Detector
| Type | Model | Output voltage (kV) | Focus size (mm) | Beam angle | Max.penetration A3 Steel | Weight of generator (kg) | Size of generator (mm) |
| XXG-1605 | 50 - 160 | 0.8×0.8 | 40 + 5° | 19 | 14.5 | 225×225×550 | |
| XXG-2005 | 50 - 200 | 2.0×2.0 | 40 + 5° | 30 | 18 | 285×285×615 | |
| XXG-2505 | 50 - 250 | 2.0×2.0 | 40 + 5° | 40 | 30.5 | 320×320×640 | |
| Frequency Conversation | XXG-3005 | 100 - 300 | 2.5×2.5 | 40 + 5° | 50 | 36.5 | 345×345×670 |
| XXQ-1605 | 50 - 160 | 0.8×0.8 | 40° | 19 | 15.2 | 225×225×585 | |
| XXQ-2005 | 50 - 200 | 1.5×1.5 | 40 + 5° | 30 | 23 | 285×285×665 | |
| XXQ-2505 | 50 - 250 | 2.0×2.0 | 40 + 5° | 40 | 35 | 320×320×730 | |
| XXQ-3005 | 100 - 300 | 2.3×2.3 | 40 + 5° | 50 | 45.5 | 345×345×830 | |
| High Frequency | EVO 160D | 20 - 160 | 1.0 | 40×60° | 30 | 22 | φ295×640 |
| EVO 200D | 30 - 200 | 1.0 | 40×60° | 43 | 23 | φ295×630 | |
| EVO 300D | 50 - 300 | 3.0 | 40×60° | 65 | 29 | φ295×774 | |
| Pulse | Golden150 | 150 | 3.0 | 40° | 12 | 4.5 | 230×103×77 |
| Golden270 | 270 | 3.0 | 40° | 25 | 5.9 | 360×108×189 | |
| Golden370 | 370 | 3.0 | 40° | 50 | 10.5 | 495×115×216 |
Digital Flat Panel Detector
| Model | Detector type | Scintillating medium | Image size | Pixel pitch | Spatial resolution | X-ray working range | Working temperature |
| Maple 3543 | A-Si | GdSO | 350×430mm | 139μm | 3.6LP/mm | 40 - 225kV | 5 - 35°C |
| Maple 2135 | A-Si | GdSO | 350×210mm | 139μm | 3.6LP/mm | 40 - 450kV | 5 - 35°C |
| Paxscan 2530HE | A-Si | Cesium Iodide | 250×300mm | 139μm | 3.6LP/mm | 20kV - 16mV | -10 - 40°C |
| Technical parameters | Details |
| Model | AL-NP-5010A |
| Analysis principle | Energy dispersive X-ray fluorescence analysis |
| Element measuring range | Any element from Na(11)-U(92) |
| Mn.measuring limit | Cd / Hg / Br / Cr / Pb ≤2ppm |
| Sample shape | Arbitrary size, any irregular shape |
| Sample type | Plastic / metal / film / powder / liquid etc |
| X-ray tube | Mo |
| Sample exposure diameter | 5-50KV |
| Detector | Target material: 1-100μA Tube voltage: 2,5,8mm Tube current: Si-PIN or SDD detector; high speed pulse height analysis system |
| High voltage generator | Special HV generator for X fluorescence |
| ADC | 2048 channels |
| Filter | 6 filters are automatically selected and converted |
| Sample observation | 200×color CCD camera |
| Analysis software | Patented software products, free upgrade for life |
| Analysis method | Thepretical α coefficient method, basic parameter method, empirical coefficient method |
| Analysis time | 30-900 seconds, adjustable |
| Operating system software | WINDOWS XP |
| Data processing system - Host | PC business model |
| Data processing system - CPU | ≥2.8G |
| Data processing system - Memory | ≥2g |
| Data processing system - CD-ROM | 8×DVD |
| Data processing system - Hard disk | ≥500G |
| Data processing system - Display | 22"or 24" LCD display |
| Working environment | Temperature 10-35℃, humidity 30-70% RH |
