

The X-ray diffractometer leverages diffraction principles to determine crystal structure, texture, and stress, performing accurate phase, qualitative, and quantitative analyses. It is widely applied in metallurgy, petroleum, chemical engineering, aerospace, research, teaching, and material production.
The AL-Y3500 series XRD is tailored for materials research and industrial analysis, blending conventional methods with specialized measurements for versatile applications.
Feature
different application fields.
The AL-Y3500 X-ray Diffractometer operates on the principle of X-ray diffraction, where incident X-rays interact with a crystal’s atomic planes, producing diffraction patterns. By analyzing these patterns, the system determines phase composition, crystal structure, texture, and residual stress with exceptional accuracy. Its high-precision goniometer, stable X-ray generator, and multi-mode scanning system ensure reproducible and consistent results across varied samples.
Unmatched Precision – Accurate diffraction angle measurements with 0.0001° reproducibility.
Stable Performance – High-stability X-ray generator ensures repeatability.
Flexible Applications – Compatible with multiple detectors and accessories.
User-Friendly – Programmed operation with integrated design and easy interface.
Safe & Reliable – Low radiation dose ensures operator safety.
Long-Term Value – Robust construction with low maintenance requirements.
Educational & Teaching Labs: Standard AL-Y3500 configuration with Cu target tube for fundamental training.
Research Centers: High-resolution model with SDD detector for advanced structural studies.
Industrial QC Departments: Customized models with fast scan capability for high-throughput analysis.
Materials Science Laboratories: Multi-detector setup for comprehensive phase and stress testing.
Metallurgy & alloy development
Petroleum & chemical engineering
Aerospace materials testing
Academic research & teaching
Quality control in material production
Nanomaterial and crystallography studies
Specifications :
| Technique parameter | Details |
| Model | AL-Y3500 (High Frequency) |
| Rated Power | 2kW 3kW |
| Tube voltage | 10-50kV 10-60kV 10-50kV 10-60kV |
| Tube current | 5-40mA 5-50mA 5-40mA 5-50mA |
| X-ray tube | Metal ceramic insulation, Cu target (Other targets can be customized) |
| Focus size | 1 x 10mm (Other sizes can be customized) |
| Stability | Better than±0.005% |
| Goniometer structure | Sample horizontal placement θs—θd |
| Radius of diffraction circle | 180mm-300mm |
| Measuring range | -110°-168° |
| Maximum positioning speed | ≤1200°/min |
| Scanning mode | Scanning mode |
| Minimum step width angle | 0.0001° |
| Angle reproducibility | 0.0001° |
| Angular deviation | ≤0.01 |
| Detector | scintillation detector (1D and SDD optional) |
| Spectral resolution | <50%(SC), ≤25%(1D, SDD) |
| Maximum linear count rate | 5x10⁴cps(SC), 9x10⁴cps(1D), 15x10⁴cps(SDD) |
| Counting mode | Differential, integral, automatic PHA, dead time correction |
| Comprehensive stability | ≤0.5 |
| Scattering line dose | ≤1μSv/h (Outside the housing) |
| Host overall dimensions | 1320×1150×1860mm 1320×1150×1860mm |
| Technique parameter | Details |
| Model | AL-Y3500 (High Frequency) |
| Rated Power | 2kW 3kW |
| Tube voltage | 10-50kV 10-60kV 10-50kV 10-60kV |
| Tube current | 5-40mA 5-50mA 5-40mA 5-50mA |
| X-ray tube | Metal ceramic insulation, Cu target (Other targets can be customized) |
| Focus size | 1 x 10mm (Other sizes can be customized) |
| Stability | Better than±0.005% |
| Goniometer structure | Sample horizontal placement θs—θd |
| Radius of diffraction circle | 180mm-300mm |
| Measuring range | -110°-168° |
| Maximum positioning speed | ≤1200°/min |
| Scanning mode | Scanning mode |
| Minimum step width angle | 0.0001° |
| Angle reproducibility | 0.0001° |
| Angular deviation | ≤0.01 |
| Detector | scintillation detector (1D and SDD optional) |
| Spectral resolution | <50%(SC), ≤25%(1D, SDD) |
| Maximum linear count rate | 5x10⁴cps(SC), 9x10⁴cps(1D), 15x10⁴cps(SDD) |
| Counting mode | Differential, integral, automatic PHA, dead time correction |
| Comprehensive stability | ≤0.5 |
| Scattering line dose | ≤1μSv/h (Outside the housing) |
| Host overall dimensions | 1320×1150×1860mm 1320×1150×1860mm |

