The AL-2700 series diffractometer is a versatile tool for analyzing various materials, including metals, inorganic compounds, composites, organic substances, and nanomaterials. It supports multiple sample types such as powders, bulk, thin films, and micro samples. Common applications span industries like clay minerals, cement, environmental research, chemical products, pharmaceuticals, asbestos, and polymers, offering precise material structure analysis across diverse fields.
Features:
Specifications :
| AL-2700A | AL-2700B | |
| Rated power | 3kW(High frequency high voltage control technology) | 4kW |
| Tube voltage | 10-60kV | 10-60kV |
| Tube current | 5-50mA | 5-80mA |
| X-ray tube | Metal ceramic tube Target material: Cu, Fe, Co, Cr, Mo etc. Power:2.4kW | Metal ceramic tube Target material: Cu, Fe, Co, Cr, Mo etc. Power:2.4kW |
| Focus size | 1x10mm, 0.4x14mm or 2x12mm | 1x10mm, 0.4x14mm or 2x12mm |
| Stability | ≤0.005% | ≤0.01% |
| Goniometer structure | Sample level(θ-θ) | Sample level(θ-θ) |
| Radius of diffraction | 225mm (or custom by request: 150-285 range) | 225mm (or custom by request: 150-285 range) |
| 2θ Scanning range | 0-160° | 0-160° |
| Scanning speed | 0.0012°-50°/min | 0.0012°-50°/min |
| Angle locating speed | 1500°/min | 1500°/min |
| Scanning fashion | θs/θd linkage / single action; continuous,stepping and Omng | θs/θd linkage / single action; continuous,stepping and Omng |
| Minimal stepping angle | 1/10000° | 1/10000° |
| Angle repeatable accuracy | 1/10000° | 1/10000° |
| 2θ Angular linearity | International standard sample (SRM1976b),the angle deviation of all peak in full spectrum are not more than 0.022 | International standard sample (SRM1976b),the angle deviation of all peak in full spectrum are not more than 0.022 |
| Detector | Proportional counters(PC) or scintillation counter(SiC), Silicon drift detector(SDD), High speed one-dimensional semiconductor array detector | Proportional counters(PC) or scintillation counter(SiC), Silicon drift detector(SDD), High speed one-dimensional semiconductor array detector |
| Maximal counting rate of linearity | 5x+105CPS(PC SC with the compensate function of drop out counting) | 15x104(SDD)+102 (one-dimensional array) |
| Energy resolution ratio | ≤25%PC, one-dimensional array, 550eV(SC), 520eV(SDD) | ≤25%PC, one-dimensional array, 550eV(SC), 520eV(SDD) |
| Counting fashion | Differential coefficient or integral, PHA automatically, dead time regulate | Differential coefficient or integral, PHA automatically, dead time regulate |
| Stability of system measure | ≤0.01% | ≤0.01% |
| Scattered rays dose | 1uSv/h(without X-ray protective device) | 1uSv/h(without X-ray protective device) |
| Instrument integrative stability | ≤0.1% | ≤0.5% |
| Figure size | 1000x800x1600mm | 1000x800x1600mm |
| AL-2700A | AL-2700B | |
| Rated power | 3kW(High frequency high voltage control technology) | 4kW |
| Tube voltage | 10-60kV | 10-60kV |
| Tube current | 5-50mA | 5-80mA |
| X-ray tube | Metal ceramic tube Target material: Cu, Fe, Co, Cr, Mo etc. Power:2.4kW | Metal ceramic tube Target material: Cu, Fe, Co, Cr, Mo etc. Power:2.4kW |
| Focus size | 1x10mm, 0.4x14mm or 2x12mm | 1x10mm, 0.4x14mm or 2x12mm |
| Stability | ≤0.005% | ≤0.01% |
| Goniometer structure | Sample level(θ-θ) | Sample level(θ-θ) |
| Radius of diffraction | 225mm (or custom by request: 150-285 range) | 225mm (or custom by request: 150-285 range) |
| 2θ Scanning range | 0-160° | 0-160° |
| Scanning speed | 0.0012°-50°/min | 0.0012°-50°/min |
| Angle locating speed | 1500°/min | 1500°/min |
| Scanning fashion | θs/θd linkage / single action; continuous,stepping and Omng | θs/θd linkage / single action; continuous,stepping and Omng |
| Minimal stepping angle | 1/10000° | 1/10000° |
| Angle repeatable accuracy | 1/10000° | 1/10000° |
| 2θ Angular linearity | International standard sample (SRM1976b),the angle deviation of all peak in full spectrum are not more than 0.022 | International standard sample (SRM1976b),the angle deviation of all peak in full spectrum are not more than 0.022 |
| Detector | Proportional counters(PC) or scintillation counter(SiC), Silicon drift detector(SDD), High speed one-dimensional semiconductor array detector | Proportional counters(PC) or scintillation counter(SiC), Silicon drift detector(SDD), High speed one-dimensional semiconductor array detector |
| Maximal counting rate of linearity | 5x+105CPS(PC SC with the compensate function of drop out counting) | 15x104(SDD)+102 (one-dimensional array) |
| Energy resolution ratio | ≤25%PC, one-dimensional array, 550eV(SC), 520eV(SDD) | ≤25%PC, one-dimensional array, 550eV(SC), 520eV(SDD) |
| Counting fashion | Differential coefficient or integral, PHA automatically, dead time regulate | Differential coefficient or integral, PHA automatically, dead time regulate |
| Stability of system measure | ≤0.01% | ≤0.01% |
| Scattered rays dose | 1uSv/h(without X-ray protective device) | 1uSv/h(without X-ray protective device) |
| Instrument integrative stability | ≤0.1% | ≤0.5% |
| Figure size | 1000x800x1600mm | 1000x800x1600mm |
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