Model :AL-3000
The AL Series X-ray Diffractometer combines advanced hardware and software for precise material analysis, including phase identification, quantitative studies, and crystal structure evaluation, suitable for research and industrial applications.
Need Help with This Product?
The AL Series X-ray Diffractometer, designed for materials research and industrial analysis, combines advanced hardware and software to deliver precise diffraction angle measurements, stable repeatability, and versatile functions like phase identification, quantitative analysis, and crystal structure studies, even under unconventional conditions, making it ideal for academic, research, and industrial applications.
Features:
| AL-3000 | |
| Rated power | 3kW |
| Tube voltage | 10-60kV |
| Tube current | 5-80mA |
| X-ray tube | glass tube, ceramic tube, ripple ceramic tube: Cu, Fe, Co, Cr, Mo etc, Power 2kW |
| Focus size | 1×10mm or 0.4×14mm or 2×12mm |
| Stability | ≤0.01% |
| Goniometer structure | Horizontal(θ-2θ) |
| Radius of diffraction | 185mm |
| Scanning range | 0-164 |
| Scanning speed | 0.0012°-70°/min |
| Max.revolving speed | 100°/min |
| Scanning fashion | θ-2θ linkage,θ,2θ single action;continuious or stepping scanning |
| Angle repeatable accuracy | 1/1000° |
| Minimal stepping angle | 1/1000° |
| Detector | proportional counters(PC) or scintillation counters(SC) |
| Maximal counting rate of linearity | 5×10⁴CPS (with the compensate function of drop out counting) |
| Energy resolution ratio | ≤25% (PC) ≤50% (SC) |
| Counting fashion | differential coefficient or integral, PHA automatically, Dead time regulate |
| Stability of system measure | ≤0.01% |
| Scattered rays dose | ≤1μSv/h(without X-ray protective device) |
| Instrument integrative stability | ≤0.5% |
| Figure size | 1100×850×1750mm |
