The AELAB CX-9500PRO Optical Emission Spectrometer is engineered for high-accuracy elemental analysis of metal materials using advanced spark and arc excitation technology. Optimized for rapid testing, the CX-9500PRO completes full elemental analysis within seconds while maintaining excellent sensitivity and long-term stability.
Utilizing a Pachen-Runge optical structure and multi high-resolution CCD/CMOS detectors, the AELAB CX-9500PRO delivers reliable spectral acquisition across a wide wavelength range, making it suitable for routine quality control and research laboratories.
The CX-9500PRO optical emission spectrometer adopts a temperature-controlled optical chamber with an argon-flushed optical path. The robust bench-top configuration supports stable operation while enabling convenient relocation within laboratory environments.
The AELAB CX-9500PRO generates plasma using digital arc and spark excitation. Emitted characteristic wavelengths from excited elements are separated through the Pachen-Runge mount and detected by CCD/CMOS sensors, allowing precise quantification of elemental concentrations.
The CX-9500PRO operates with proprietary analysis software supporting theoretical alpha-coefficient, FP, and EC methods. Software updates and technical support are provided free of charge for long-term laboratory integration.
| Parameter | CX-9500PRO |
|---|---|
| Wavelength Range | 170–800 nm |
| Excitation Method | Digital arc and spark |
| Detector | CCD/CMOS |
| Weight | 30 kg |
The AELAB CX-9500PRO Optical Emission Spectrometer is widely used in metal testing laboratories, manufacturing facilities, and foundries for elemental composition analysis of ferrous and non-ferrous alloys.
The CX-9500PRO is designed for compliance-oriented laboratory environments, supporting standardized testing workflows, calibration traceability, and quality control procedures aligned with ISO and GLP practices.
Specifications :
| Optical Structure | Pachen-Runge Mount |
| Diameter of Rowland Circle | 350 mm |
| Wavelength Range | 170 nm – 800 nm |
| Detector | Multi high resolution CCD/CMOS detectors |
| Type of Optic | Argon flushed |
| Pixel Resolution | 30 pm |
| Full Spectrum | Optical chamber temperature is controlled automatically |
| Light Source | Digital arc and spark source / New plasma generator |
| Spark Frequency | 100 – 1000 Hz |
| Plasma Current | 1 – 80 A |
| Ignition Voltage | > 8000 V |
| Spark Stand | Argon flushed with minimal consumption of Argon Spray discharge electrode technology Adjustable sample clamp |
| Measurable Elements | Fe base, Al base, Cu base, Zn base, etc. |
| Dimension | 700 mm (L) × 660 mm (W) × 340 mm (H) |
| Weight | 30 kg |
| Storage Temperature | 0 – 45 °C |
| Operating Temperature | 10 – 30 °C (23 ± 2 °C recommended) |
| Power | AC 220 V ±10%, 50/60 Hz |
| Power Consumption | Excitation: 300 W, Standby: 50 W |
| Argon Quality | 99.999%, Argon pressure > 4 MPa |
| Argon Consumption | 5 L/min during spark mode, standby 0.5 L/min |
| Analysis Range | From Na (11) to U (92) |
| Limit of Detection | 1 ppm – 100 ppm |
| Sample Shape | No requirement |
| Sample Type | Solid / Powder / Liquid |
| Sample Room Size | Φ270 × 100 mm |
| X-Ray Tube Target | Optional |
| X-Ray Tube Voltage Range | 5 – 50 kV |
| X-Ray Tube Current Range | 1 – 1000 μA |
| Collimator | 2, 4, 6, 8 mm |
| Detector | FastSDD detector |
| Counting Ability | 1,300,000 |
| Filter | CPS |
| Sample Observation | 1.3 million pixels CCD camera |
| Analysis Software | Proprietary software products |
| Software Update | Free lifetime upgrade |
| Test Method | Theoretical α-coefficient method, FP |
| Test Environment | Temperature: 10–35 °C, RH: 30–70% |
| Dimension and Weight | 600 (W) × 500 (D) × 500 (H) mm, 60 kg |
| Power Supply Requirements | AC 220 ±10%, 50/60 Hz |
| Test Time | 100 – 300 s (Adjustable) |
| Optical Structure | Pachen-Runge Mount |
| Diameter of Rowland Circle | 350 mm |
| Wavelength Range | 170 nm – 800 nm |
| Detector | Multi high resolution CCD/CMOS detectors |
| Type of Optic | Argon flushed |
| Pixel Resolution | 30 pm |
| Full Spectrum | Optical chamber temperature is controlled automatically |
| Light Source | Digital arc and spark source / New plasma generator |
| Spark Frequency | 100 – 1000 Hz |
| Plasma Current | 1 – 80 A |
| Ignition Voltage | > 8000 V |
| Spark Stand | Argon flushed with minimal consumption of Argon Spray discharge electrode technology Adjustable sample clamp |
| Measurable Elements | Fe base, Al base, Cu base, Zn base, etc. |
| Dimension | 700 mm (L) × 660 mm (W) × 340 mm (H) |
| Weight | 30 kg |
| Storage Temperature | 0 – 45 °C |
| Operating Temperature | 10 – 30 °C (23 ± 2 °C recommended) |
| Power | AC 220 V ±10%, 50/60 Hz |
| Power Consumption | Excitation: 300 W, Standby: 50 W |
| Argon Quality | 99.999%, Argon pressure > 4 MPa |
| Argon Consumption | 5 L/min during spark mode, standby 0.5 L/min |
| Analysis Range | From Na (11) to U (92) |
| Limit of Detection | 1 ppm – 100 ppm |
| Sample Shape | No requirement |
| Sample Type | Solid / Powder / Liquid |
| Sample Room Size | Φ270 × 100 mm |
| X-Ray Tube Target | Optional |
| X-Ray Tube Voltage Range | 5 – 50 kV |
| X-Ray Tube Current Range | 1 – 1000 μA |
| Collimator | 2, 4, 6, 8 mm |
| Detector | FastSDD detector |
| Counting Ability | 1,300,000 |
| Filter | CPS |
| Sample Observation | 1.3 million pixels CCD camera |
| Analysis Software | Proprietary software products |
| Software Update | Free lifetime upgrade |
| Test Method | Theoretical α-coefficient method, FP |
| Test Environment | Temperature: 10–35 °C, RH: 30–70% |
| Dimension and Weight | 600 (W) × 500 (D) × 500 (H) mm, 60 kg |
| Power Supply Requirements | AC 220 ±10%, 50/60 Hz |
| Test Time | 100 – 300 s (Adjustable) |
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