The AL-27mini Desktop X-ray Diffractometer is a compact, high-performance instrument designed for commercial process and quality control, leveraging advanced XRD technology with a focus on miniaturization. It offers precise qualitative and quantitative analysis, along with detailed crystal structure analysis of both metal and nonmetal samples. This desktop model is particularly effective for industries such as catalysts, titanium dioxide, cement, and pharmaceuticals, providing a cost-effective and efficient solution for material analysis in these fields. Its compact design makes it ideal for environments where space is limited without sacrificing performance.
Features:
Specifications :
| Service rating (Tube voltage, tube current) | 600W (40kV,15mA) or 1200W (40kV,30mA) Stability: 0.005% |
| X-ray tube | Metal-ceramic X-ray tube, Cu target, Power 2.4kW, Focus size:1 x 10 mm Air cooling or water cooling (water flow rate ≥ 1L/min) |
| Goniometer | θs - θd, diffraction radius 150mm |
| Measuring method | Continuous, stepping, Omng |
| Angular measurement range | During leakage time, 9 s,θd is -3-150° |
| Minimum step with | 0.0001° |
| Angular reproducibility | 0.0001° |
| Drive mode | servo motor drive + optical encoder control technology |
| Angle Positioning speed | 1500°/min |
| counter | Closed Proportional detector or High speed one-dimensional semiconductor counter |
| Energy spectrum resolution | <25% |
| Max. linear counting rate | ≥5x 105cps ( Proportional ) ≥1x 107cps ( One-dimensional semiconductor linear array detector ) |
| Computer | Dell Laptop |
| Software - Controlling software | Windows 7 operating system; control the tube voltage, tube current, shutter of the X-ray generator and do aging training automatically; Control the goniometer continuous or stepping scanning and diffraction data collection; do routine processing: automatic peak-seeking, manual peak-seeking, integrated intensity, peak height, core, background deduction, smoothness, Peak shape amplification and spectrogram comparison, etc. |
| Software - Data processing software | Qualitative and quantitative analysis of material phases, Kα1, α2 peeling, Full width at half maximum (FWHM) calculation, crystal size calculation, crystal cell measuring, second kind stress calculation, diffraction line indexation, multiple plotting, 3D plotting, diffraction data calibration, background, subtraction, quantitative analysis without standards, full spectral fitting (WPF), XRD diffraction image simulation, etc. |
| Scattered radiation protection | Lead + lead glass protection, shutter windows and protective guard linkage, the scattered radiation dose does not exceed 1 μ Sv/h. |
| Instrument Comprehensive regulation | <1% |
| Sample quantity of one-time loading | Auto sample changer, 6 samples can be put one time. |
| Overall dimension | 640 x 500 x 770 (w x d x h) mm |
| Service rating (Tube voltage, tube current) | 600W (40kV,15mA) or 1200W (40kV,30mA) Stability: 0.005% |
| X-ray tube | Metal-ceramic X-ray tube, Cu target, Power 2.4kW, Focus size:1 x 10 mm Air cooling or water cooling (water flow rate ≥ 1L/min) |
| Goniometer | θs - θd, diffraction radius 150mm |
| Measuring method | Continuous, stepping, Omng |
| Angular measurement range | During leakage time, 9 s,θd is -3-150° |
| Minimum step with | 0.0001° |
| Angular reproducibility | 0.0001° |
| Drive mode | servo motor drive + optical encoder control technology |
| Angle Positioning speed | 1500°/min |
| counter | Closed Proportional detector or High speed one-dimensional semiconductor counter |
| Energy spectrum resolution | <25% |
| Max. linear counting rate | ≥5x 105cps ( Proportional ) ≥1x 107cps ( One-dimensional semiconductor linear array detector ) |
| Computer | Dell Laptop |
| Software - Controlling software | Windows 7 operating system; control the tube voltage, tube current, shutter of the X-ray generator and do aging training automatically; Control the goniometer continuous or stepping scanning and diffraction data collection; do routine processing: automatic peak-seeking, manual peak-seeking, integrated intensity, peak height, core, background deduction, smoothness, Peak shape amplification and spectrogram comparison, etc. |
| Software - Data processing software | Qualitative and quantitative analysis of material phases, Kα1, α2 peeling, Full width at half maximum (FWHM) calculation, crystal size calculation, crystal cell measuring, second kind stress calculation, diffraction line indexation, multiple plotting, 3D plotting, diffraction data calibration, background, subtraction, quantitative analysis without standards, full spectral fitting (WPF), XRD diffraction image simulation, etc. |
| Scattered radiation protection | Lead + lead glass protection, shutter windows and protective guard linkage, the scattered radiation dose does not exceed 1 μ Sv/h. |
| Instrument Comprehensive regulation | <1% |
| Sample quantity of one-time loading | Auto sample changer, 6 samples can be put one time. |
| Overall dimension | 640 x 500 x 770 (w x d x h) mm |
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