

The AELAB EDX-9000 X-Ray Fluorescence Spectrometer is engineered to perform rapid and accurate non-destructive elemental analysis for laboratory and industrial testing. Based on advanced XRF detection technology, the system delivers stable excitation and precise analysis across a wide range of elements.
Incorporating intelligent vacuum system XRF technology, the AELAB EDX-9000 achieves effective excitation and accurate analysis for light elements such as Na, Mg, Al, and Si, as well as high atomic number elements including Cr, Ni, and Mo, significantly improving analytical efficiency and test throughput.
The AELAB EDX-9000 features a high-efficient and extremely thin window X-ray tube combined with a Silicon Drift Detector (SDD). The instrument integrates an optical amplification system, high signal-to-noise electronic circuit unit, and an automatic collimator and filter switching mechanism to ensure stable analytical performance.
The AELAB EDX-9000 operates by exciting samples with controlled X-ray energy, inducing characteristic fluorescence emission from constituent elements. The emitted signals are captured by the SDD detector and processed through digital multi-channel technology to quantify elemental composition with high energy resolution and spectral stability.
The AELAB EDX-9000 is equipped with an integrated LCD display that directly presents testing results including tube voltage, tube current, and vacuum degree. External software and communication interface details are not specified in the provided documentation.
| Element Range | Na–U |
| Detector Type | Silicon Drift Detector (SDD) |
| Instrument Weight (kg) | 60 |
The AELAB EDX-9000 X-Ray Fluorescence Spectrometer is widely applied in mineral analysis, alloy composition analysis, smelting process control, full-element analysis, and hazardous element analysis. The system supports laboratory research, industrial quality control, and material verification workflows.
The AELAB EDX-9000 is designed for operation within regulated laboratory and industrial environments. Analytical repeatability, spectral stability, and electronic signal integrity support quality assurance processes aligned with standardized testing protocols.
Discover accurate and stable elemental analysis with the AELAB EDX-9000 X-Ray Fluorescence Spectrometer — engineered by AELAB for advanced laboratory and industrial material testing.

Specifications :
| Product Type | X-Ray Fluorescence Spectrometer |
| Product Name | EDX-9000 |
| Analytical Elements | Na to U |
| Analytical Range | ppm–99.99% (different elements enjoy different analytical range) |
| Simultaneous Analysis | Capable of testing tens of elements simultaneously |
| Measurement Time | 30–200 s |
| Energy Resolution | 145±5 eV |
| Tube Voltage | 5 kV–50 kV |
| Tube Current | 50 μA–1000 μA |
| Measurable Objects | Powder, Solid, Liquid |
| Voltage Input | AC 110 V / 220 V |
| Operating Temperature (°C) | 15–30 °C |
| Operating Humidity | 35%–70% |
| Instrument Dimensions (mm) | 600 × 500 × 500 |
| Weight (kg) | 60 |
| Product Type | X-Ray Fluorescence Spectrometer |
| Product Name | EDX-9000 |
| Analytical Elements | Na to U |
| Analytical Range | ppm–99.99% (different elements enjoy different analytical range) |
| Simultaneous Analysis | Capable of testing tens of elements simultaneously |
| Measurement Time | 30–200 s |
| Energy Resolution | 145±5 eV |
| Tube Voltage | 5 kV–50 kV |
| Tube Current | 50 μA–1000 μA |
| Measurable Objects | Powder, Solid, Liquid |
| Voltage Input | AC 110 V / 220 V |
| Operating Temperature (°C) | 15–30 °C |
| Operating Humidity | 35%–70% |
| Instrument Dimensions (mm) | 600 × 500 × 500 |
| Weight (kg) | 60 |
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